SciAps Z-70 XRF Analyzer
SciAps Z-70 XRF Analyzer uses a 6 mJ laser, over 50 times more powerful than typical material ID instruments that operate at 25-60 μJ. The additional power enables surface cleaning of the material before analysis. The other advantage is gating, which reduces the background noise of the sample and gives a clearer spectrum to better analyze different materials that micro-Joule laser instruments have struggled with in the past.
Scannable alloys:
Aluminum: Be, Mg, Al, Si, Ti, V, Cr, Mn, Fe, Ni, Cu, Zn, Zr, Sn, Pb, Bi, Ag
Stainless Steels: Al, Si, Ti, V, Cr, Mn, Fe, Ni, Cu, Nb, Mo, W
Iron Base: Si, Ti, V, Cr, Mn, Fe, Cu, Ni, Nb, Mo, Pb
Copper Base: Be, Al, Si, Cr, Mn, Fe, Ni, Cu, Zn, Ag, Sn, Pb, Bi
Nickel Base: Al, Si, Ti, Cr, Mn, Fe, Co, Ni, Cu, Nb, Mo, W, Hf, Ta, Re
Titanium Base: Al, Ti, V, Cr, Fe, Cu, Zr, Nb, Mo, Sn
Magnesium Base: tba
Clean Results, Clear Advantage
The unique air pump design in the SciAps Z-70 provides the best solution for safeguarding against contaminated test results. The air pump disperses any residual dirt particles from the testing windows, thereby guaranteeing accurate results and minimizing the necessity for frequent cleaning.
Precision, Versatility, and Reliability
The Z-70 has an internal camera for precise targeting of analysis locations, essential for turnings; a macro camera for photo-documentation of samples, and for reading bar codes and QR codes; a patented ‘sample sensor’ ensuring Class 1 operation; an intuitive Android operating system offering user-friendly navigation; a high-
resolution rear-facing display; rugged metal body; a narrow snout for welds or difficult-to-access test locations; and an air pump that keeps the analysis window clean for best results
Redefining Power
The SciAps Z-70 delivers a 6 mJ laser, nearly 50 times more powerful than any other material ID instrument available in the market. This improves test speed and performance in scrap yard environments
where dirty samples often require grinding for micro LIBS material ID instruments.